SYNTHESIS, IRRADIATION & ANALYSIS OF MATERIALS

Expertise

The Synthesis, Irradiation & Analysis of Materials platform (SIAM)  expertise in materials characterization relies on its capacity to use and combine various spectroscopies (XPS, ToF-SIMS & IBA). These techniques provide a complete evaluation of almost any kind of sample such as: metals, welds, glass, polymers, powders, liquids, in vivo biological material, ...

SIAM has several facilities for functionalizing materials and/or synthesizing thin films by plasma treatments.

Our experience, from several Regional and European Commission funded projects, qualify us for the analysis of complex samples such as: nanoparticles inside complex matrices (food, culture medium, cells from in vitro experiments and organs from in vivo experiments).

General overview of the SIAM platform

What they say about us...

The Synthesis, Irradiation & Analysis of Materials platform (SIAM) is active in both the synthesis and the characterization of materials and nanomaterials. SIAM performs fundamental research in materials sciences, surfaces, interfaces and ion/matter interaction. Different kinds of materials and/or samples, coming from materials sciences, life sciences but not only (materials evaluation inside a biological matrix) can be thoroughly analyzed.

One of SIAM’s major assets is a unique set of expertise in different spectroscopies techniques (high and lower energies) which can be coupled to nuclear analysis. This, thanks to a state-of-the-art equipment, a philosophy of constant development and a highly qualified team.

SIAM can provide characterization and/or analysis solution in fields such as: photovoltaic, intelligent coatings, nanomaterials, public health, biomedical applications to name a few. Our client’s portfolio covers several industrial sectors, SMEs and academia. Our clients beneficiate of an overall technical approach (one stop shop).

REMARKABLE EQUIPMENT

XPS
  • Metal multilayer profiling   
  • Corrosion problems and origin
  • Determination of layer oxidation states

ToF-SIMS
  • Detection of contaminant traces in different matrices (application in electronics, photovoltaics...)
  • Elementary and molecular imaging of polymer samples

IBA

 
  • Biodistribution and biopersistence (in vivo) of NMs, characterization and quantification
  • Characterisation of thin film materials and airborne particulate matter
  • Phase transformation studies

 CASE STUDIES

Discover how our expertise and techniques can help solve your issues...  

 

 SOME EC FUNDED PROJECTS (FP7 - H2020)

 

 KEY WORDS

Surface analysis – XPS - ToF-SIMS - Nuclear Reactions Analysis – PIXE – PIGE – RBS – BS – NRA – RNDA – ERDA - ToF-ERD – IBA – UPS - (HR)EELS – LEED – Microprobe - Life sciences – Radiobiology – Plasma – Coatings – Sputtering – Nanomaterials - Surface engineering - Monte-Carlo simulations for new materials - Depth profiling - Chemical imaging - Contact angle - Virtual Coater